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hal_rpc_pkey_list() was a simplistic solution that worked when the
keystore only supported a handful of keys and we needed a quick
temporary solution in time for a workshop. It doesn't handle large
numbers of keys well, and while we could fix that, all of its
functionality is now available via more robust API functions, so
simplifying the API by deleting it seems best.
Since this change required mucking with dispatch vectors yet again, it
converts them to use C99 "designated initializer" syntax.
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pkey attribute API is now just set_attributes() and get_attributes().
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Passes minimal unit-testing and the same minimal tests report that it
does deliver the desired performance speed-up. More testing and much
cleanup still needed.
Attribute API not quite stable yet, we're probably going to want to
remove all the singleton attribute operations from the RPC protocol,
and it turns out that ks_delete_attributes() has enough code in common
with ks_set_attributes() that it makes more sense to handle the former
as a special case of the latter.
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This is not yet complete, only the ks_volatile driver supports it,
ks_flash will be a bit more complicated and isn't written yet.
At the moment, this adds a complete duplicate set of
{set,get,delete}_attributes() functions in parallel to the earlier
{set,get,delete}_attribute() functions. We will almost certainly want
to get rid of the duplicates, probably (but not necessarily) the
entire single-attribute suite. At the moment, though, we want both
sets so we can compare execution speeds of the two sets of functions.
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Result of running all these timing tests is about what theory would
have predicted: read time does not vary significantly between RAM and
flash, but write time sure does.
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Watching the pinwheel makes it clear that the painfully slow execution
of test_attribute_bloat_flash_many() isn't a single hidously long
delay anywhere, rather it's a long steady stream of slow operations
and it's the cumulative time that's hurting us. Most likely this is
entirely dominated by flash write time, and suggests that it may be
worth the additional API and implementation complexity to handle
setting a complete set of attributes in a single operation, so that we
only have to pay the flash write toll once.
Will probably require further testing before we can make an informed
decision.
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New test class to thrash the keystore attribute mechanism.
Added wrapper classes to encapsulate the more obscure bits of the
multiple Python public key APIs we're using in a single uniform API,
which lets us simplify some of the tests considerably.
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Incidental minor refactoring of hal_rpc_server_dispatch().
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PKey objects can now be used as context managers, in which case the
key handle will be closed when the block exits.
HSM.pkey_find() now returns a generator which will iterate through the
full set of results, making additional RPC calls as necessary.
NIST ECDSA test vector test refactored to remove duplicated code.
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The debugging code was for tracking down what turned out to be a race
condition in the Alpha's flash driver code (see sw/stm32); much of
this was temporary, and will be removed in a (near) future commit, but
some of the techniques were useful and belong in the repository in
case we need to pull them back for something similar in the future.
hal_ks_index_fsck() attempts to diagnose all the things I found wrong
in the ks_flash index after one long series of errors. As presently
written, it doesn't attempt to fix anything, just diagnose errors: the
intent is that we can call this, before and after every modification
if necessary, to poinpoint exactly which calls introduce errors. Once
things stablize a bit, we may want to crank down the number of calls
to this (it's a bit expensive, since it checks the entire index), and
perhaps add the ability to clean up whatever errors it might find; the
latter might be a good candidate for a CLI command.
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This is very incomplete. Portions of it are still verbatim copies of
the PKCS #11 unit tests, and have not yet been pruned for relevance,
much less converted to the corresponding libhal tests.
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